Paper
7 November 1994 Polarization characterization of Ly alpha holographic gratings with a triple-reflection polarizer
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Abstract
The diffraction efficiency of holographic gratings depends on the degree and orientation of the linear polarization of the incident light. A test has been run to measure the reflectance efficiency at Kr 1236 angstrom of two holographic gratings in the orders +1, 0, $min1, as a function of the angle of the incident beam polarization plane. To this purpose, a triple-reflection polarizer, optimized for Ly(alpha) (1216 angstrom) has been fabricated and characterized. The test has been run to demonstrate that the coronal resonantly scattered Ly(alpha) can be measured using a holographic grating in the Ly(alpha) channel of the ultraviolet coronagraph spectrograph (UVCS) of the Solar and Heliospheric Observatory (SOHO) without introducing relevant polarization biases inside the instrument.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marco Romoli, Silvano Fineschi, Larry D. Gardner, and John L. Kohl "Polarization characterization of Ly alpha holographic gratings with a triple-reflection polarizer", Proc. SPIE 2283, X-Ray and Ultraviolet Spectroscopy and Polarimetry, (7 November 1994); https://doi.org/10.1117/12.193203
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Cited by 2 scholarly publications.
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KEYWORDS
Polarizers

Polarization

Holography

Diffraction gratings

Sensors

Modulation

Magnesium fluoride

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