Paper
3 March 1995 Phase problem and the determination of sample profiles in neutron-specular reflection
R. Lipperheide
Author Affiliations +
Proceedings Volume 2339, International Conference on Neutrons and Their Applications; (1995) https://doi.org/10.1117/12.204177
Event: 4th International Conference on Applications of Nuclear Techniques: Neutrons and their Applications, 1994, Crete, Greece
Abstract
The role of the reflection phase in the determination of the scattering-length density profile in neutron specular reflection is emphasized. Various schemes for obtaining information on this phase as input to the solution of the inverse scattering problem are discussed. The possible effects of the finite thickness of the substrate on the measurements are considered.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Lipperheide "Phase problem and the determination of sample profiles in neutron-specular reflection", Proc. SPIE 2339, International Conference on Neutrons and Their Applications, (3 March 1995); https://doi.org/10.1117/12.204177
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KEYWORDS
Reflectivity

Reflection

Semiconducting wafers

Specular reflections

Absorption

Inverse scattering problem

Phase measurement

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