Paper
12 December 1994 Two-directional spatial-carrier phase-shifting method for analysis of complex interferograms
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Abstract
Various interferometric and fringe projection techniques may result in complex interferograms with the information about the phenomena tested. Recent applications require the analysis on the base of a single interferogram. Here, we address two problems: simultaneous analysis of the information about two events and analysis of interferogram with high phase gradients in both x and y directions. The analysis of an interferogram is performed by the spatial-carrier phase-shifting method used sequentially for x and y sampling directions. The error analysis of the two procedures proposed is presented.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maria Pirga and Malgorzata Kujawinska "Two-directional spatial-carrier phase-shifting method for analysis of complex interferograms", Proc. SPIE 2340, Interferometry '94: New Techniques and Analysis in Optical Measurements, (12 December 1994); https://doi.org/10.1117/12.195907
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Cited by 4 scholarly publications.
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KEYWORDS
Fringe analysis

Error analysis

Phase shifts

Fourier transforms

Sensors

Spatial frequencies

Experimental mechanics

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