Line model for multisignature Gibbs classification

Ian R. Greenshields; Junchul Chun

doi:10.1117/12.198857

6 January 1994 Line model for multisignature Gibbs classification

Ian R. Greenshields, Junchul Chun

Proceedings Volume 2348, Imaging and Illumination for Metrology and Inspection; (1994) https://doi.org/10.1117/12.198857
Event: Photonics for Industrial Applications, 1994, Boston, MA, United States

Abstract

The performance of the Gibbs Classifier over a statistically heterogeneous image can be improved if the locally stationary regions in the image are disassociated from each other through the mechanism of the interaction parameters defined at the local neighborhood level. This usually involves the construction of a line process for the image. In this paper we describe a method for constructing a line process for multisignature images based on the differential (total derivative) of the image which, when expressed statistically, can provide an a priori estimate of the line field.

Citation Download Citation

Ian R. Greenshields and Junchul Chun "Line model for multisignature Gibbs classification", Proc. SPIE 2348, Imaging and Illumination for Metrology and Inspection, (6 January 1994); https://doi.org/10.1117/12.198857

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