Fluorescence scanning near-field optical microscopy (FSNOM) by measuring the decay time of a fluorescent particle

Dominique Barchiesi; Thierry Pagnot; Christian Pieralli; Daniel Van Labeke

doi:10.1117/12.205916

30 March 1995 Fluorescence scanning near-field optical microscopy (FSNOM) by measuring the decay time of a fluorescent particle

Dominique Barchiesi, Thierry Pagnot, Christian Pieralli, Daniel Van Labeke

Author Affiliations +

Proceedings Volume 2384, Scanning Probe Microscopies III; (1995) https://doi.org/10.1117/12.205916
Event: Photonics West '95, 1995, San Jose, CA, United States

Abstract

We propose a Fluorescent Scanning Near-Field Optical Microscope (FSNOM) based upon the measurement of the decay time of a fluorescent particle adsorbed on a SNOM tip. The purpose of the experiment is to measure the decay time variations of the fluorescent particle when the tip is scanned at a few nanometers from the surface of a sample. We describe the experimental set-up and present a theoretical model: it calculates, by a perturbation method, the variations of the life-time on a rough surface. The formalism is rapidly described and first theoretical life- time signals are presented.

Citation Download Citation

Dominique Barchiesi, Thierry Pagnot, Christian Pieralli, and Daniel Van Labeke "Fluorescence scanning near-field optical microscopy (FSNOM) by measuring the decay time of a fluorescent particle", Proc. SPIE 2384, Scanning Probe Microscopies III, (30 March 1995); https://doi.org/10.1117/12.205916

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