Measurement of kinds of thresholds during the interaction between the laser beam and the CCD

Xiao-Wu Ni; Jian Lu; Zhen-Hua Lin; Anzhi He

doi:10.1117/12.206520

10 April 1995 Measurement of kinds of thresholds during the interaction between the laser beam and the CCD

Xiao-Wu Ni, Jian Lu, Zhen-Hua Lin, Anzhi He

Proceedings Volume 2415, Charge-Coupled Devices and Solid State Optical Sensors V; (1995) https://doi.org/10.1117/12.206520
Event: IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology, 1995, San Jose, CA, United States

Abstract

The interaction process of laser and charge-coupled devices (CCD) having MOS structure has been analyzed in brief, and several kinds of damage thresholds have been put forward. On the basis of experimental test, the heat melting threshold, optical breakdown threshold, and direct damage threshold produced by a Q-switched Nd:YAG laser acted the CCD and laser energy threshold causing the whole device to fail have been obtained first.

Citation Download Citation

Xiao-Wu Ni, Jian Lu, Zhen-Hua Lin, and Anzhi He "Measurement of kinds of thresholds during the interaction between the laser beam and the CCD", Proc. SPIE 2415, Charge-Coupled Devices and Solid State Optical Sensors V, (10 April 1995); https://doi.org/10.1117/12.206520

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