Paper
10 April 1995 Stability of lumogen films on CCDs
Michael A. Damento, Andrew A. Barcellos, William V. Schempp
Author Affiliations +
Proceedings Volume 2415, Charge-Coupled Devices and Solid State Optical Sensors V; (1995) https://doi.org/10.1117/12.206517
Event: IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology, 1995, San Jose, CA, United States
Abstract
Fluorescent lumogen films are now widely used for improving the UV quantum efficiency of CCDs and other silicon photodetectors. Because of the organic nature of lumogen and its low melting and boiling points, stability of the films has been in question. We present results of stability tests in which quantum efficiency and film characteristics are evaluated with respect to exposure to illumination, elevated temperature, and reduced pressure. Our results indicate a high tolerance to UV and visible illumination, and to slightly elevated temperatures (95 degree(s)C) at normal operating pressures. However, high vacuum conditions (10-6 torr) can produce voids in the films at even slightly elevated temperatures.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael A. Damento, Andrew A. Barcellos, and William V. Schempp "Stability of lumogen films on CCDs", Proc. SPIE 2415, Charge-Coupled Devices and Solid State Optical Sensors V, (10 April 1995); https://doi.org/10.1117/12.206517
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CITATIONS
Cited by 4 scholarly publications and 1 patent.
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KEYWORDS
Charge-coupled devices

Quantum efficiency

Ultraviolet radiation

Crystals

Silicon films

Photodetectors

Silicon

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