Twinning-induced stress and electric field concentrations in ferroelectric ceramics

Qing Jiang; Ying Zhang

doi:10.1117/12.200927

2 February 1995 Twinning-induced stress and electric field concentrations in ferroelectric ceramics

Qing Jiang, Ying Zhang

Proceedings Volume 2427, Active Materials and Smart Structures; (1995) https://doi.org/10.1117/12.200927
Event: Symposium on Active Materials and Smart Structures: Society of Engineering Science 31st Annual Meeting, 1994, College Station, TX, United States

Abstract

Experimental investigations suggest that microcracking may be the major cause for the commonly-encountered degradation of ferroelectric actuators, namely electric fatigue. The present analysis, based upon the lattice distortions occurring during the formation of electric twins, indicates that intersections of domain walls with grain boundaries are likely to be origins of microcracks because of the concentrations of stress and electric fields arising due to the incompatibility of the lattice distortions with the grain boundary constraints. This further motivated an asymptotic analysis on the stress and electric field concentrations near intersections of domain walls with grain boundaries. This analysis is carried out within a frame work of electrostatics for deformable continua. Assuming that the electromechanical state in each of the ferroelectric domains is slightly distorted from one of the natural states of the crystal, the authors developed a piecewise linearized model for which concentrations of stress and electric fields correspond to singularities of these fields. The asymptotic analysis concludes that both the stress and electric fields exhibit a power-law singularity. Several examples indicate that the order of singularity depends upon the crystal orientation and the orientations of the domain walls with respect to the grain boundary which they intersect.

Citation Download Citation

Qing Jiang and Ying Zhang "Twinning-induced stress and electric field concentrations in ferroelectric ceramics", Proc. SPIE 2427, Active Materials and Smart Structures, (2 February 1995); https://doi.org/10.1117/12.200927

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