Status Of Cryogenic Refractive-Index Measurements

William L. Wolfe; Arthur G. DeBell; James M. Palmer

doi:10.1117/12.959348

3 November 1980 Status Of Cryogenic Refractive-Index Measurements

William L. Wolfe, Arthur G. DeBell, James M. Palmer

Proceedings Volume 0245, Cryogenically Cooled Sensor Technology; (1980) https://doi.org/10.1117/12.959348
Event: 24th Annual Technical Symposium, 1980, San Diego, United States

Abstract

This review paper summarizes and identifies the sources of cryogenic refractive index measurements in the infrared. Representative refractive index versus temperature and wave-length data are presented for the following materials: germanium, silicon, hot-pressed cadmium telluride (Irtran 6), hot-pressed zinc sulfide (Irtran 2), polycrystalline cadmium telluride, cesium iodide, cesium bromide, zinc selenide, and birefringent thallium arsenic selenide. The measurement techniques and the errors associated with the measurements are discussed, and the need for additional measurements is delineated.

Citation Download Citation

William L. Wolfe, Arthur G. DeBell, and James M. Palmer "Status Of Cryogenic Refractive-Index Measurements", Proc. SPIE 0245, Cryogenically Cooled Sensor Technology, (3 November 1980); https://doi.org/10.1117/12.959348

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available