Paper
18 September 1995 X-ray and XUV imaging and spectroscopy of dense plasmas using multilayer optics
John F. Seely, Charles M. Brown, Michael P. Kowalski, Raymond G. Cruddace, Troy W. Barbee Jr., William R. Hunter, Jack C. Rife
Author Affiliations +
Abstract
High-reflectance multilayer mirrors and gratings have been developed and implemented in the x-ray and XUV regions. The imaging and spectroscopic instruments have high throughput and can be positioned at a large distance from the radiation source where damage from the plasma debris and the radiation flux does not occur.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John F. Seely, Charles M. Brown, Michael P. Kowalski, Raymond G. Cruddace, Troy W. Barbee Jr., William R. Hunter, and Jack C. Rife "X-ray and XUV imaging and spectroscopy of dense plasmas using multilayer optics", Proc. SPIE 2523, Applications of Laser Plasma Radiation II, (18 September 1995); https://doi.org/10.1117/12.220969
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Multilayers

Coating

Mirrors

Plasmas

Reflectivity

Imaging spectroscopy

Extreme ultraviolet

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