Oblique-incidence reflectometry: one relative profile measurement of diffuse reflectance yields two optical parameters

Lihong V. Wang; Shao-Pow Lin; Steven L. Jacques; Frank K. Tittel; Jennifer Harder; John Jancarik; Beth Michelle Mammini; Ward Small IV; Luiz Barroca Da Silva

doi:10.1117/12.228887

27 December 1995 Oblique-incidence reflectometry: one relative profile measurement of diffuse reflectance yields two optical parameters

Lihong V. Wang, Shao-Pow Lin, Steven L. Jacques, Frank K. Tittel, Jennifer Harder, John Jancarik, Beth Michelle Mammini, Ward Small IV, Luiz Barroca Da Silva

Author Affiliations +

Proceedings Volume 2627, Optical Biopsies; (1995) https://doi.org/10.1117/12.228887
Event: BiOS Europe '95, 1995, Barcelona, Spain

Abstract

A new, simple and quick approach, oblique-incidence reflectometry, was used to measure the absorption and reduced scattering coefficients of a semi-infinite turbid medium. An obliquely incident light beam causes the center of the far diffuse reflectance to shift from the point of incidence, where the far diffuse reflectance refers to the diffuse reflectance that is several transport mean free paths away from the incident point. The amount of shift yields the diffusion constant by a simple formula, and the slope of the diffuse reflectance yields the attenuation coefficient. Only the relative profile of the diffuse reflectance is needed to deduce both optical parameters, which makes this method attractive in clinical settings because it does not require a stringent calibration for absolute quantity measurements. This method was tested theoretically by Monte Carlo simulations and experimentally by a reflectometer. Because this method can be used to measure optical properties of biological tissues quickly and requires only inexpensive equipment, it has potential clinical application to the diagnosis of disease or monitoring of treatments.

Citation Download Citation

Lihong V. Wang, Shao-Pow Lin, Steven L. Jacques, Frank K. Tittel, Jennifer Harder, John Jancarik, Beth Michelle Mammini, Ward Small IV, and Luiz Barroca Da Silva "Oblique-incidence reflectometry: one relative profile measurement of diffuse reflectance yields two optical parameters", Proc. SPIE 2627, Optical Biopsies, (27 December 1995); https://doi.org/10.1117/12.228887

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