Materials inspection and process control using compensated laser ultrasound evaluation (CLUE): demonstration of a low-cost laser ultrasonic sensor

David M. Pepper; Gilmore J. Dunning; Phillip V. Mitchell; Stephen William McCahon; Marvin B. Klein; Thomas R. O'Meara

doi:10.1117/12.237768

8 April 1996 Materials inspection and process control using compensated laser ultrasound evaluation (CLUE): demonstration of a low-cost laser ultrasonic sensor

David M. Pepper, Gilmore J. Dunning, Phillip V. Mitchell, Stephen William McCahon, Marvin B. Klein, Thomas R. O'Meara

Author Affiliations +

Proceedings Volume 2703, Lasers as Tools for Manufacturing of Durable Goods and Microelectronics; (1996) https://doi.org/10.1117/12.237768
Event: Photonics West '96, 1996, San Jose, CA, United States

Abstract

We demonstrate the use of a nonsteady-state photo-induced-emf adaptive photodetector as a robust, low-cost laser ultrasonic sensor. This class of sensor enables high-fractional bandwidth ultrasound detection and, in addition, all-optical compensation of adverse in-factory noise, including vibration, speckle, relative platform motion, and optical fiber modal dispersion. Reference-beam and fiber-based time-delay interferometric configurations were demonstrated, as well as the use of a diode laser as a compact optical probe.

Citation Download Citation

David M. Pepper, Gilmore J. Dunning, Phillip V. Mitchell, Stephen William McCahon, Marvin B. Klein, and Thomas R. O'Meara "Materials inspection and process control using compensated laser ultrasound evaluation (CLUE): demonstration of a low-cost laser ultrasonic sensor", Proc. SPIE 2703, Lasers as Tools for Manufacturing of Durable Goods and Microelectronics, (8 April 1996); https://doi.org/10.1117/12.237768

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