Ray tracing from two-dimensional randomly rough surfaces

Neil Charles Bruce

doi:10.1117/12.231082

5 February 1996 Ray tracing from two-dimensional randomly rough surfaces

Neil Charles Bruce

Proceedings Volume 2730, Second Iberoamerican Meeting on Optics; (1996) https://doi.org/10.1117/12.231082
Event: Second Iberoamerican Meeting on Optics, 1995, Guanajuato, Mexico

Abstract

Scattering from 2-dimensional randomly rough surfaces is considered using a simple ray trace. The effects of phase and polarization are taken into account. It is shown that the patterns observed experimentally are due to the interference of the double scattered rays which gives a pattern with four-fold symmetry.

Citation Download Citation

Neil Charles Bruce "Ray tracing from two-dimensional randomly rough surfaces", Proc. SPIE 2730, Second Iberoamerican Meeting on Optics, (5 February 1996); https://doi.org/10.1117/12.231082

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