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The X-ray interferometers are analyzed as a tool to measure a phase distribution of X-ray beams transmitted through phase objects. We calculate beam width using a dynamical diffraction theory of a spherical wave. The width defines the image resolution. From these results, it is found that the X ray quadruple-Lane-case (LLLL) interferometer has high image resolution compared with the X-ray triple-Lane-case (LLL) interferometer.
T. Nakano
"Analysis of x-ray interferometers for phase distribution measurement", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 277808 (1 September 1996); https://doi.org/10.1117/12.2298890
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T. Nakano, "Analysis of x-ray interferometers for phase distribution measurement," Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 277808 (1 September 1996); https://doi.org/10.1117/12.2298890