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Comparisons of theoretical and experimental images of optically thick objects are presented. Selected objects are phase steps and ridges of rectangular profile, of a conducting material. To obtain the experimental images a Linnik interference microscope is used. To simulate the images a theory based on the integral equation method is employed.
J. Felix Aguilar
"Theoretical and experimental results in the imaging of optically thick objects in scanning microscopy", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 27783J (1 September 1996); https://doi.org/10.1117/12.2299009
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J. Felix Aguilar, "Theoretical and experimental results in the imaging of optically thick objects in scanning microscopy," Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 27783J (1 September 1996); https://doi.org/10.1117/12.2299009