Paper
26 April 1996 Self-organization of phthalocyanine molecules along the atomic step arrays on sapphire
Takayoshi Hayashi, Akira Yamashita, Tohru Maruno, Stefan Foelsch, Shiro Matsumoto, Hideo Konami, Masahiro Hatano
Author Affiliations +
Abstract
An example of structural control of organic thin films by self-organization is described. Equally spaced parallel atomic step arrays exist on polished sapphire (1012) surface. Dibenzo [b, t] phthalocyaninato-Zn (II) (ZnDBPc) molecules deposited by UHV molecular- beam deposition on this surface stack themselves to form columnar crystal grains. Since the direction of these columns is parallel to the atomic step direction, thin films of ZnDBPc grown on the sapphire (1012) surfaces show unidirectional in-plane ordering over the entire substrate. The direction and spacing of the parallel atomic step arrays are directly related to the misorientation direction and angle of the polished surface from the exact (1012) surface. Therefore the ordering direction of the ZnDBPc thin film has no relation to the crystallographic axes of the sapphire, which is totally unlike ordinary epitaxial growth. Since the step spacings can be controlled over a wide range, we can expect to be able to improve the ordering by adjusting the step spacings to the lattice spacing of organic crystals.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Takayoshi Hayashi, Akira Yamashita, Tohru Maruno, Stefan Foelsch, Shiro Matsumoto, Hideo Konami, and Masahiro Hatano "Self-organization of phthalocyanine molecules along the atomic step arrays on sapphire", Proc. SPIE 2779, 3rd International Conference on Intelligent Materials and 3rd European Conference on Smart Structures and Materials, (26 April 1996); https://doi.org/10.1117/12.237063
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Sapphire

Surface finishing

Molecules

Crystals

Polishing

Thin films

Atomic force microscopy

Back to Top