Paper
29 April 1996 Liquid crystalline systems with twist-grain boundary phases
Nonna L. Kramarenko, Viktor I. Kulishov, Lidiya A. Kutulya, Natalya I. Shkolnikova
Author Affiliations +
Proceedings Volume 2795, Nonlinear Optics of Liquid and Photorefractive Crystals; (1996) https://doi.org/10.1117/12.239192
Event: Nonlinear Optics of Liquid and Photorefractive Crystals, 1995, Ai-Danil, Crimea, Ukraine
Abstract
The phase diagrams of the liquid crystalline systems which consisted of the achiral ester mesogen (the eutectic mixture of 4-n-hexyloxyphenyl 4-n-octyloxybenzoate and 4-n- octyloxyphenyl 4-n-hexyloxybenzoate) and the structurally similar chiral dopants are studied. The S-1-phenyl- and S-1-benzylethylamine N-arylidene derivatives including the ester group in arylidene fragment are used as chiral dopants. The twist grain boundary (TGB) region occurs in all investigated systems. This phase state is proved by small angle x-ray scattering and helical pitch measurements. The TGB states on the SmA side (TGBA) and SmC* side (TGBc) have different structure according to x-ray analysis data. The chiral dopants capacity for (theta) c smectic tilt angle decreasing is considered as an important factor of the TGB state formation in the liquid crystalline systems investigated. The chiral dopant structure peculiarities influence the TGB phase topology and the phase boundary slopes. The boundaries of the TGBc region are more sensitive to chiral dopants concentration changes in comparison with the TGBA boundaries.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nonna L. Kramarenko, Viktor I. Kulishov, Lidiya A. Kutulya, and Natalya I. Shkolnikova "Liquid crystalline systems with twist-grain boundary phases", Proc. SPIE 2795, Nonlinear Optics of Liquid and Photorefractive Crystals, (29 April 1996); https://doi.org/10.1117/12.239192
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Cited by 2 scholarly publications.
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KEYWORDS
Liquid crystals

Shape memory alloys

Crystals

Liquids

X-rays

Critical dimension metrology

Crystallography

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