Paper
12 July 1996 Advancement of x-ray microscopy technology and its application to metal solidification studies
William F. Kaukler, Peter A. Curreri
Author Affiliations +
Abstract
The technique of x-ray projection microscopy is being used to view, in real time, the structures and dynamics of the solid-liquid interface during solidification. By employing a hard x-ray source with sub-micron dimensions, resolutions of 2 micrometers can be obtained with magnifications of over 800 X. Specimen growth conditions need to be optimized and the best imaging technologies applied to maintain x-ray image resolution, contrast and sensitivity. It turns out that no single imaging technology offers the best solution and traditional methods like radiographic film cannot be used due to specimen motion (solidification). In addition, a special furnace design is required to permit controlled growth conditions and still offer maximum resolution and image contrast.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William F. Kaukler and Peter A. Curreri "Advancement of x-ray microscopy technology and its application to metal solidification studies", Proc. SPIE 2809, Space Processing of Materials, (12 July 1996); https://doi.org/10.1117/12.244353
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Cited by 1 scholarly publication.
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KEYWORDS
X-rays

Charge-coupled devices

Solids

CCD image sensors

Interfaces

X-ray imaging

Sensors

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