Paper
30 September 1996 Gallium nitride films made by liquid target pulsed laser deposition
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Abstract
In this paper, formation of single c-axis oriented wurtzite gallium nitride films on various substrates as fused silica, Si and sapphire with ZnO buffer layers by liquid target pulsed laser deposition is reported. The deposition conditions were optimized with a temperature of 600 degrees C and an ammonia pressure of 750mTorr. X-ray diffraction, scanning electron microscopy, tunneling electron microscopy, room temperature Hall effect measurement, UV/VIS spectrometry, Rutherford backscattering spectroscopy and x- ray photoelectron spectroscopy were used to characterize the as-grown films. It is shown that high quality single c-axis orientation stoichiometric gallium nitride films could be formed with a thin zinc oxide buffer layer. The FWHM of x- ray rocking curve of the peak of GaN grown on ZnO/sapphire was as narrow as 0.52 degrees. It was also found that the surface morphology was greatly improved with the zinc oxide buffer.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
X. W. Sun, Rongfu Xiao, and HoiSing Kwok "Gallium nitride films made by liquid target pulsed laser deposition", Proc. SPIE 2888, Laser Processing of Materials and Industrial Applications, (30 September 1996); https://doi.org/10.1117/12.253102
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KEYWORDS
Gallium nitride

Zinc oxide

Silica

Liquids

Sapphire

Pulsed laser deposition

X-ray diffraction

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