Paper
20 January 1997 Research on a geometric model-based 3D inspection machine
Jihong Chen, Huicheng Zhou, DaoShan O'yang, Shawn Buckley
Author Affiliations +
Abstract
Currently only contact systems--where a probe touches the part on its surfaces--have the resolution required for inspecting in the manufacturing industry. in this paper, the development of a non-contact structured light machine vision (SLMV) inspecting system using structured light imaged by a machine vision camera given fast inspection at high resolution. The key technology of this system is inspecting simulation software using a geometric model of the inspected part. The geometric model eliminates spurious range data from multiple reflections that has plagued previous SLMV systems. In addition, the new system eliminates 99 percent of the data to be studied in detail, reducing both the pixels acquired and the pixels analyzed to just those which contribute to determining the part's dimensions. Resolution is improved by averaging many points over part's surface. Experimentally, a single-axis machine measured several dimensions of a part in less than a second to micron resolution.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jihong Chen, Huicheng Zhou, DaoShan O'yang, and Shawn Buckley "Research on a geometric model-based 3D inspection machine", Proc. SPIE 2909, Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II, (20 January 1997); https://doi.org/10.1117/12.263325
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Inspection

Visual process modeling

Cameras

3D modeling

Systems modeling

Imaging systems

Machine vision

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