Birefringence determination in ion-exchanged waveguides

Mario Bertolotti; W. A. Ramadan; F. Monteleone; Eugenio Fazio; Stefano Pelli; Giancarlo C. Righini

doi:10.1117/12.262434

20 December 1996 Birefringence determination in ion-exchanged waveguides

Mario Bertolotti, W. A. Ramadan, F. Monteleone, Eugenio Fazio, Stefano Pelli, Giancarlo C. Righini

Proceedings Volume 2954, Fiber Integrated Optics; (1996) https://doi.org/10.1117/12.262434
Event: Advanced Imaging and Network Technologies, 1996, Berlin, Germany

Abstract

Birefringence as high as 10^-2 + 10^-3 in ion-exchanged planar waveguides has been measured by using a double Lloyd's interferometer. Birefringence seems to be produced by the distribution of the mechanical stresses induced during the fabrication process. A new point-by-point calculation to fit the experimental data is proposed which can give new information about the ion-diffusion process and the stress distribution.

Citation Download Citation

Mario Bertolotti, W. A. Ramadan, F. Monteleone, Eugenio Fazio, Stefano Pelli, and Giancarlo C. Righini "Birefringence determination in ion-exchanged waveguides", Proc. SPIE 2954, Fiber Integrated Optics, (20 December 1996); https://doi.org/10.1117/12.262434

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