Doppler-shifted self-reflected wave from a semiconductor

Alex Schuelzgen; S. Hughes; Nasser Peyghambarian

doi:10.1117/12.275588

6 June 1997 Doppler-shifted self-reflected wave from a semiconductor

Alex Schuelzgen, S. Hughes, Nasser Peyghambarian

Proceedings Volume 2994, Physics and Simulation of Optoelectronic Devices V; (1997) https://doi.org/10.1117/12.275588
Event: Photonics West '97, 1997, San Jose, CA, United States

Abstract

We report the first experimental observation of a self- reflected wave inside a very dense saturable absorber. An intense femtosecond pulse saturates the absorption and causes a density front moving into the semiconductor sample. Due to the motion of the boundary between saturated and unsaturated areas of the sample the light reflected at this boundary is red-shifted by the Doppler effect. The spectrally shifted reflection makes it possible to distinguish between surface reflection and self-reflection and is used to proof the concept of the dynamic nonlinear skin effect experimentally. Quite well agreement with model calculations is found.

Citation Download Citation

Alex Schuelzgen, S. Hughes, and Nasser Peyghambarian "Doppler-shifted self-reflected wave from a semiconductor", Proc. SPIE 2994, Physics and Simulation of Optoelectronic Devices V, (6 June 1997); https://doi.org/10.1117/12.275588

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