Paper
11 April 1997 Optical characterization methods of InP-based micro-opto-electro-mechanical systems
Ronan Le Dantec, Taha Benyattou, Gerard Guillot, Christian Seassal, Jean Louis Leclercq, Xavier Letartre, A. Gagnaire, Michel Gendry, Pierre Viktorovitch, Ramdane Benferhat, D. Rondi, Robert R. Blondeau
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Abstract
We have studied actuable suspended beams that form vertical optical resonant cavities. They are fabricated by sacrificial layers etching techniques on InP. They can be used as tunable optical filters for telecommunication applications. In this paper, we report optical characterizations of those devices. We have used micro reflectivity and optical profilometer measurements to make those characterizations. We have developed a micro- reflectivity experimental setup which uses the confocal principle. We have shown the deformation of the suspended beams and the variation of the reflectivity response induced by electrostatic actuation of the devices.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ronan Le Dantec, Taha Benyattou, Gerard Guillot, Christian Seassal, Jean Louis Leclercq, Xavier Letartre, A. Gagnaire, Michel Gendry, Pierre Viktorovitch, Ramdane Benferhat, D. Rondi, and Robert R. Blondeau "Optical characterization methods of InP-based micro-opto-electro-mechanical systems", Proc. SPIE 3008, Miniaturized Systems with Micro-Optics and Micromechanics II, (11 April 1997); https://doi.org/10.1117/12.271421
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KEYWORDS
Reflectivity

Bridges

Semiconductors

Mirrors

Indium gallium arsenide

Profilometers

Microopto electromechanical systems

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