Paper
10 April 1997 Use of real-time latent images to write long holographic diffraction gratings in photoresist
Bruce R. Napier, Nicholas J. Phillips
Author Affiliations +
Abstract
It is well known that photoresist undergoes a chemical change on exposure which results in a variation in its refractive index. In the recording of diffraction gratings this index change leads to a detectable phase grating before development: the so called latent image. The growth of the grating may be observed in real time by monitoring the diffraction efficiency of the first order beam from this latent image. By superposing the diffracted beams from two such latent gratings a moire pattern may be observed, from which the position of the fringes of one grating relative to the other may be obtained. If one of the gratings is moved relative to the other then this pattern may be used as the trigger for an optical exposure, and gratings may be written to cover a length independent of the size of the exposing beams.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bruce R. Napier and Nicholas J. Phillips "Use of real-time latent images to write long holographic diffraction gratings in photoresist", Proc. SPIE 3011, Practical Holography XI and Holographic Materials III, (10 April 1997); https://doi.org/10.1117/12.271351
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Diffraction gratings

Refractive index

Photoresist materials

Diffraction

Molecules

Holography

Sensors

RELATED CONTENT

Recording beam modulation during grating formation
Proceedings of SPIE (October 26 2004)
Holographic data storage using photopolymers
Proceedings of SPIE (September 20 1999)
Modulation of recording beams during grating formation
Proceedings of SPIE (September 01 2004)
Z scan studies of refractive index changes in azo dye...
Proceedings of SPIE (March 26 1998)

Back to Top