PROCEEDINGS VOLUME 3029
ELECTRONIC IMAGING '97 | 8-14 FEBRUARY 1997
Machine Vision Applications in Industrial Inspection V
Editor(s): A. Ravishankar Rao, Ning S. Chang
Editor Affiliations +
IN THIS VOLUME

6 Sessions, 20 Papers, 0 Presentations, 0 Posters
Algorithms I  (4)
ELECTRONIC IMAGING '97
8-14 February 1997
San Jose, CA, United States
Algorithms I
Priyan Gunatilake, Mel Siegel, Angel G. Jordan, Gregg W. Podnar
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271231
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271241
Iqbal M. Dar, Waqar Mahmood, George Vachtsevanos
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271245
Natalia H. Kroupnova, Maarten J. Korsten
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271246
Imaging Techniques
Thierry Maniere, Ryad Benosman, Claude Gastaud, Jean Devars
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271247
Charalampos Bakolias, Andrew K. Forrest
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271248
Claudine Coulot, Sophie Kohler-Hemmerlin, Christophe Dumont, Denis Aluze, Bernard Lamalle
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271249
Jyrki Laitinen
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271250
Imaging Systems
J. H. Magnus Byne, James A. D. W. Anderson
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271232
Joon Hee Han, Kyueun Yi
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271233
Texture Methods
Abdurrahman Carkacioglu, Fatos T. Yarman-Vural
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271234
Christian Kueblbeck, Thomas Wagner
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271235
Algorithms II
Lew F.C. Lew Yan Voon, Patrice Bolland, Olivier Laligant, Patrick Gorria, B. Gremillet, L. Pillet
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271236
John Y. Goulermas, Panos Liatsis
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271237
Bingcheng Li, Jesus Rene Villalobos, Jose Mario Gallegos, Sergio D. Cabrera
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271238
Huicheng Zhou, Jihong Chen, Yang Daoshan, Shawn Buckley
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271239
Matching Techniques
Miwako Hirooka, Kazuhiko Sumi, Manabu Hashimoto, Haruhisa Okuda, Shinichi Kuroda
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271240
Bingcheng Li, Dongming Zhao, Jesus Rene Villalobos, Sergio D. Cabrera
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271242
Douglas D. Bacon
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271243
Imaging Systems
Helen H. Chen, Tin M. Aye, Dai Hyun Kim, Jack A. Latchinian, Vernon A. Brown, Andrew A. Kostrzewski, Gajendra D. Savant, Tomasz P. Jannson, Charles G. Pergantis
Proceedings Volume Machine Vision Applications in Industrial Inspection V, (1997) https://doi.org/10.1117/12.271244
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