Mechanism for recording and erasing optical information by laser radiation on an SiO2-(Co+Si)-SiO2-Si multilayer structure

Arthur Medvids; Maris Knite; J. Kaupuzs; V. Frishfelds

doi:10.1117/12.267686

28 February 1997 Mechanism for recording and erasing optical information by laser radiation on an SiO₂-(Co+Si)-SiO₂-Si multilayer structure

Arthur Medvids, Maris Knite, J. Kaupuzs, V. Frishfelds

Author Affiliations +

Proceedings Volume 3055, International Conference on Optical Storage, Imaging, and Transmission of Information; (1997) https://doi.org/10.1117/12.267686
Event: International Conference on Optical Storage, 1996, Kiev, Ukraine

Abstract

We present in this paper results of investigation of optical properties of SiO₂-(Co plus Si)-SiO₂-Si structures under laser treatment with Q-switched YAG:Nd and carbon dioxide lasers. The photo-thermo-chemical reaction of Co with Si has a threshold character. No changes in optical properties of (Co plus Si) mixture was observed up to intensities of carbon dioxide laser radiation 2 MW/cm². At larger intensities the reflection coefficient R decreases from 70% to 45% with increasing of the intensity up to 8 MW/cm². When this multilayer structure is irradiated with Q-switched YAG:Nd laser with radiation intensity from 14 MW/cm² to 53 MW/cm², the magnitude of reflection coefficient returns to its initial value 70%. It means that the information recorded by carbon-dioxide laser is erased. Calculations of the temperature field during irradiation with carbon-dioxide and YAG:Nd laser showed that the phase transition from mixture (Co plus Si) to CoSi₂ caused by irradiation with carbon-dioxide laser results in recording of information, whereas the thermal impact caused by irradiation with YAG:Nd laser results in amorphization of CoSi₂ and erasing of information.

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Arthur Medvids, Maris Knite, J. Kaupuzs, and V. Frishfelds "Mechanism for recording and erasing optical information by laser radiation on an SiO₂-(Co+Si)-SiO₂-Si multilayer structure", Proc. SPIE 3055, International Conference on Optical Storage, Imaging, and Transmission of Information, (28 February 1997); https://doi.org/10.1117/12.267686

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KEYWORDS

Carbon dioxide lasers

Picosecond phenomena

Crystals

Laser optics

Optical properties

Silicon

Data storage

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