Paper
20 June 1997 Reusability measure of DEVS simulation models in DEVSim++ environment
Yoonil Choi, Tag Gon Kim
Author Affiliations +
Abstract
This paper deals with reusability of the DEVS (discrete event systems specification) models in the hierarchical models development framework within an object-oriented simulation environment, called DEVSim++. The DEVSim++ environment supports models reusability in two dimensions during models development. One way of reusability is achieved from the hierarchical model construction technology from the DEVS formalism and the other from the inheritance mechanism from the underlying object-oriented environment. This paper proposes a set of metrics to measure both hierarchical reuse and inheritance reuse of DEVS models developed in DEVSim++. It also suggests a set of guidelines to improve reusability. Empirical measurement of the proposed metrics shows that the guidelines improve reusability of DEVS simulation models in the DEVSim++ environment.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yoonil Choi and Tag Gon Kim "Reusability measure of DEVS simulation models in DEVSim++ environment", Proc. SPIE 3083, Enabling Technology for Simulation Science, (20 June 1997); https://doi.org/10.1117/12.276716
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Systems modeling

Data modeling

Solid modeling

Environmental sensing

Process modeling

Composites

Network on a chip

RELATED CONTENT


Back to Top