PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The aim of the present work is determination of characteristic of the 2D position sensitive detector in order to establish conditions, limitations and corrections needed for quantitative measurements of the intensity of scattered X-ray radiation. The analysis of the possibility to introduce corrections of nonuniformities in sensitivity of the detector along its surface, being responsible for distortions in the measured intensity profiles.
Andrzej Wasiak andPawel Sajkiewicz
"Errors in x-ray intensity measurements by means of 2D position-sensitive detector", Proc. SPIE 3095, X-Ray Investigations of Polymer Structures, (18 February 1997); https://doi.org/10.1117/12.267187
ACCESS THE FULL ARTICLE
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Andrzej Wasiak, Pawel Sajkiewicz, "Errors in x-ray intensity measurements by means of 2D position-sensitive detector," Proc. SPIE 3095, X-Ray Investigations of Polymer Structures, (18 February 1997); https://doi.org/10.1117/12.267187