Optical characterization of the internal electric field distribution under bias of CdZnTe radiation detectors

H. Walter Yao; Richard J. M. Anderson; Ralph B. James

doi:10.1117/12.277705

7 July 1997 Optical characterization of the internal electric field distribution under bias of CdZnTe radiation detectors

H. Walter Yao, Richard J. M. Anderson, Ralph B. James

Author Affiliations +

Proceedings Volume 3115, Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications; (1997) https://doi.org/10.1117/12.277705
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

Polarized transmission optical profiles were used to characterize the CdZnTe (CZT) room-temperature radiation detectors. The internal electric field distributions of the CZT detectors under bias were probed by a 952 nm illumination between two crossed Glan-Taylor polarizers. A 16-bit digital charge coupled device (CCD) was employed as an image sensor. The 2-dimensional (2D) images reflecting the internal electrical field intensity changes were obtained utilizing the Pockels electro-optic effect. CZT detectors of crystal sizes of 5 by 5 by 5 mm were investigated under different bias voltages. Uniform and nonuniform internal electric field distributions throughout the detector volumes, under different light illumination conditions, were observed and analyzed. A theoretical model of the semiconductor energy band structure under the bias was established and used to understand the measurement results.

Citation Download Citation

H. Walter Yao, Richard J. M. Anderson, and Ralph B. James "Optical characterization of the internal electric field distribution under bias of CdZnTe radiation detectors", Proc. SPIE 3115, Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications, (7 July 1997); https://doi.org/10.1117/12.277705

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