Backscattering Mueller matrices from bead-blasted aluminium surfaces

Gareth D. Lewis; David L. Jordan

doi:10.1117/12.283874

3 October 1997 Backscattering Mueller matrices from bead-blasted aluminium surfaces

Gareth D. Lewis, David L. Jordan

Proceedings Volume 3121, Polarization: Measurement, Analysis, and Remote Sensing; (1997) https://doi.org/10.1117/12.283874
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

The backscattering Mueller matrices for a range of bead- blasted aluminium samples having a range of surface roughness and slopes are investigated using a 632.8nm linearly polarized HeNe laser. The analyzing polarizing optics and detector are fixed in the backscattering direction and the angle of incidence varied from 0 degrees to 90 degrees. A computer controlled Mueller matrix scatterometer determines the matrix elements. The incident polarization states are set via combinations of a polarizer and waveplates and the backscattered light is Fourier analyzed using a rotating compensator and fixed linear polarizer. The surfaces were characterized using a surface profilometer and the variation of the Mueller matrix elements with incidence angle determined. Only four elements of the normalized Mueller matrix are non-zero. Of these, three vary with incidence angle and the fourth is normalized to unity. A depolarization term P_D calculated from the matrix elements is shown to decrease with increasing angle of incidence. Its value at normal incidence reduces with increasing bead-blast pressure.

Citation Download Citation

Gareth D. Lewis and David L. Jordan "Backscattering Mueller matrices from bead-blasted aluminium surfaces", Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); https://doi.org/10.1117/12.283874

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