Measurement of low-level strain retardation in optical materials

Theodore C. Oakberg

doi:10.1117/12.278974

3 October 1997 Measurement of low-level strain retardation in optical materials

Theodore C. Oakberg

Proceedings Volume 3121, Polarization: Measurement, Analysis, and Remote Sensing; (1997) https://doi.org/10.1117/12.278974
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

A method for measurement of low-level strain birefringence in optical elements and materials will be described. This method provides for the simultaneous measurement of magnitude and direction of the net retardation without the necessity of sample rotation. Good agreement was obtained between measured retardation and independent measurements of a polymer waveplate. Measurements were also made of uncalibrated samples with retardation magnitudes down to 1.5 nanometers.

Citation Download Citation

Theodore C. Oakberg "Measurement of low-level strain retardation in optical materials", Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); https://doi.org/10.1117/12.278974

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