Paper
16 October 1997 Industrial applications of accelerator-based infrared sources: analysis using infrared microspectroscopy
Jean Louis Bantignies, Gilbert Fuchs, G. Lawrence Carr, Paul Dumas, Catherine Wilhelm
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Abstract
Infrared Microspectroscopy, using a globar source, is now widely employed in the industrial environment, for the analysis of various materials. Since synchrotron radiation is a much brighter source, an enhancement of an order of magnitude in lateral resolution can be achieved. Thus, the combination of IR microspectroscopy, and synchrotron radiation provides a powerful tool enabling sample regions only few microns size to be studied. This opens up the potential for analyzing small particles. Some examples for hair, bitumen and polymer are presented.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jean Louis Bantignies, Gilbert Fuchs, G. Lawrence Carr, Paul Dumas, and Catherine Wilhelm "Industrial applications of accelerator-based infrared sources: analysis using infrared microspectroscopy", Proc. SPIE 3153, Accelerator-Based Infrared Sources and Applications, (16 October 1997); https://doi.org/10.1117/12.290257
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Cited by 10 scholarly publications.
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KEYWORDS
Polymers

Infrared radiation

Imaging spectroscopy

Synchrotrons

Absorbance

Multilayers

Synchrotron radiation

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