Film calibration for soft x-ray wavelengths

Gregory J. Tallents; J. Krishnan; L. Dwivedi; David Neely; I. C. Edmond Turcu

doi:10.1117/12.279423

14 October 1997 Film calibration for soft x-ray wavelengths

Gregory J. Tallents, J. Krishnan, L. Dwivedi, David Neely, I. C. Edmond Turcu

Proceedings Volume 3157, Applications of X Rays Generated from Lasers and Other Bright Sources; (1997) https://doi.org/10.1117/12.279423
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

The response of photographic film to X-rays from laser- plasma is of practical interest. Film is often used for the ultimate detection of x-rays in crystal and grating spectrometers and in imaging instruments such as pinhole cameras largely because of its high spatial resolution (approximately 1 - 10 microns). Characteristic curves for wavelengths--3 nm and 23 nm are presented for eight x-ray films (Kodak 101-01, 101-07, 104-02, Kodak Industrex CX, Russian UF-SH4, UF-VR2, Ilford Q plates and Shanghai 5F film). The calibrations were obtained from the emission of laser-produced carbon plasmas and a Ne-like Ge X-ray laser.

Citation Download Citation

Gregory J. Tallents, J. Krishnan, L. Dwivedi, David Neely, and I. C. Edmond Turcu "Film calibration for soft x-ray wavelengths", Proc. SPIE 3157, Applications of X Rays Generated from Lasers and Other Bright Sources, (14 October 1997); https://doi.org/10.1117/12.279423

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