Paper
14 November 1997 Titanium nitride film prepared by ion-beam-enhanced deposition and its properties
Han-wei Liu, Zhidong Huang, Yuan-ru Chen
Author Affiliations +
Proceedings Volume 3241, Smart Materials, Structures, and Integrated Systems; (1997) https://doi.org/10.1117/12.293488
Event: Far East and Pacific Rim Symposium on Smart Materials, Structures, and MEMS, 1997, Adelaide, Australia
Abstract
The titanium nitride film has been synthesized by electron beam evaporation depositino f titanium and bombardment with a xenon ion beam in th environment of nitrogen gas. The component, valence state and structure of titanium nitride film ar analyzed by means of XPS, AES, and X-ray difraction. The reslts shows that th main cooposition of the film are titnaium nitride crystallites with preferentia orientatinslightly and fine gran size,exept predominant titanium oxide film on surface of thefilm and there exists a signficiant mixed layser of titanium, nitrogen and ferrum between the film and its matrix, whichplayed an important role for increasing adhesion between the film and substrate. finally, its some properties have been investigated.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Han-wei Liu, Zhidong Huang, and Yuan-ru Chen "Titanium nitride film prepared by ion-beam-enhanced deposition and its properties", Proc. SPIE 3241, Smart Materials, Structures, and Integrated Systems, (14 November 1997); https://doi.org/10.1117/12.293488
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KEYWORDS
Titanium

Ion beams

Nitrogen

Crystals

Electron beams

Silicon

Xenon

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