Paper
8 April 1998 Narrow-gap semiconductor photodiodes
Antoni Rogalski, Manijeh Razeghi
Author Affiliations +
Abstract
At present efforts in IR detector research are directed towards improving the performance of single element devices and large electronically scanned arrays, and to obtain higher operating temperature of detectors. Another important aim is to make IR detectors cheaper and more convenient to use. Investigations of the performance of narrow gap semiconductor photodiodes are presented. Recent progress in different IR photodiode technologies is discussed: HgCdTe photodiodes, InSb photodiodes, alternative to HgCdTe III-V and II-VI ternary alloy photodiodes, and monolithic lead chalcogenide photodiodes. Investigations of the performance of photodiodes operated at short wavelength IR, 1-3 $mUm; medium wavelength IR, 3-5 micrometers ; and long wavelength IR, 8- 14 micrometers ; are presented. The operating temperature for HgCdTe detectors is higher than for other types of photon detectors. HgCdTe detectors with background limited performance operate with thermoelectric coolers in the medium wavelength range, instead the long wavelength detectors operate at approximately equals 100 K. HgCdTe is characterized by high absorption coefficient and quantum efficiency and relatively low thermal generation rate compared to other detectors.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Antoni Rogalski and Manijeh Razeghi "Narrow-gap semiconductor photodiodes", Proc. SPIE 3287, Photodetectors: Materials and Devices III, (8 April 1998); https://doi.org/10.1117/12.304467
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Cited by 7 scholarly publications.
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KEYWORDS
Photodiodes

Sensors

Mercury cadmium telluride

Semiconductors

Thermography

Lead

Doping

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