Characterization of microlens arrays for integral field spectroscopy

David Lee; Jeremy R. Allington-Smith; Robert Content; Roger Haynes

doi:10.1117/12.316794

9 July 1998 Characterization of microlens arrays for integral field spectroscopy

David Lee, Jeremy R. Allington-Smith, Robert Content, Roger Haynes

Proceedings Volume 3355, Optical Astronomical Instrumentation; (1998) https://doi.org/10.1117/12.316794
Event: Astronomical Telescopes and Instrumentation, 1998, Kona, HI, United States

Abstract

One of the most exciting operational modes of the new generation of 8-m class telescopes will be integral field spectroscopy. Many of the current designs of integral field units use microlens arrays as a way of sampling the focal plane of the telescope. Integral field spectroscopy places demanding requirements on the optical quality of the microlens arrays. In this paper we describe these requirements and report on an extensive series of optical tests to characterize microlens arrays in the laboratory. The tests were carried out on prototype microlens arrays intended for use in various Durham instrument projects. The lenses tested had excellent positional accuracy and consistency of focal length. However detailed measurements of the point spread function showed a core with good image quality but with a background level of diffuse scattered light. This scattered light causes a throughput loss in the instrument of around approximately 20%. This result was verified for the Spectroscopic Multimode InfraRed Fiber System (SMIRFS) integral field unit by absolute throughput tests carried out during commissioning of the instrument at the United Kingdom Infrared Telescope.

Citation Download Citation

David Lee, Jeremy R. Allington-Smith, Robert Content, and Roger Haynes "Characterization of microlens arrays for integral field spectroscopy", Proc. SPIE 3355, Optical Astronomical Instrumentation, (9 July 1998); https://doi.org/10.1117/12.316794

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