Advanced image processing for defect visualization in infrared thermography

Yuri A. Plotnikov; William P. Winfree

doi:10.1117/12.304745

26 March 1998 Advanced image processing for defect visualization in infrared thermography

Yuri A. Plotnikov, William P. Winfree

Proceedings Volume 3361, Thermosense XX; (1998) https://doi.org/10.1117/12.304745
Event: Aerospace/Defense Sensing and Controls, 1998, Orlando, FL, United States

Abstract

Results of a defect visualization process based on pulse IR thermography are presented. Algorithms have been developed to reduce the amount of operator participation required in the process of interpreting thermographic images. The algorithms determine the defect's depth and size from the temporal and spatial thermal distributions that exist on the surface of the investigated object following thermal excitation. A comparison of the result from thermal contrast, time derivative, and phase analysis methods for defect visualization are presented. These comparisons are based on 3D simulations of a test case representing a plate with multiple delaminations. Comparisons are also based on experimental data obtained from a specimen with flat bottom holes and a composite panel with delaminations.

Citation Download Citation

Yuri A. Plotnikov and William P. Winfree "Advanced image processing for defect visualization in infrared thermography", Proc. SPIE 3361, Thermosense XX, (26 March 1998); https://doi.org/10.1117/12.304745

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