Device reliability issues in field emission displays

Babu Chalamala; Robert H. Reuss; Troy A. Trottier; Cecil W. Penn; Yi Wei

doi:10.1117/12.321806

14 September 1998 Device reliability issues in field emission displays

Babu Chalamala, Robert H. Reuss, Troy A. Trottier, Cecil W. Penn, Yi Wei

Proceedings Volume 3363, Cockpit Displays V: Displays for Defense Applications; (1998) https://doi.org/10.1117/12.321806
Event: Aerospace/Defense Sensing and Controls, 1998, Orlando, FL, United States

Abstract

Field emission displays are currently making the transition from R&D into prototypes and early production. Device reliability is a critical issue in realization of successful field emission displays that are able to compete with other established technologies like active matrix liquid crystal displays and thin film electroluminescent displays. In this paper, we review the fundamental issues affecting the reliability and operational life of field emission display systems.

Citation Download Citation

Babu Chalamala, Robert H. Reuss, Troy A. Trottier, Cecil W. Penn, and Yi Wei "Device reliability issues in field emission displays", Proc. SPIE 3363, Cockpit Displays V: Displays for Defense Applications, (14 September 1998); https://doi.org/10.1117/12.321806

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available