When is a feature really there: the SiZer approach

J. Stephen Marron; Probal Chaudhuri

doi:10.1117/12.323850

18 September 1998 When is a feature really there: the SiZer approach

J. Stephen Marron, Probal Chaudhuri

Proceedings Volume 3371, Automatic Target Recognition VIII; (1998) https://doi.org/10.1117/12.323850
Event: Aerospace/Defense Sensing and Controls, 1998, Orlando, FL, United States

Abstract

Statistical smoothing methods are useful for finding important and nonobvious structure in data. However, some of the features discovered in this way can be spurious sampling artifacts. The SiZer approach (based on studying statistical SIgnificance of ZERo crossings of smoothed estimates) to analyzing which visible features represent important underlying structures, is discussed.

Citation Download Citation

J. Stephen Marron and Probal Chaudhuri "When is a feature really there: the SiZer approach", Proc. SPIE 3371, Automatic Target Recognition VIII, (18 September 1998); https://doi.org/10.1117/12.323850

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