Test system design used to characterize and test the MOSAD technology multiplexed oversampled A/D all-digital FPA

Jan M. Braathen

doi:10.1117/12.317617

22 July 1998 Test system design used to characterize and test the MOSAD technology multiplexed oversampled A/D all-digital FPA

Jan M. Braathen

Author Affiliations +

Proceedings Volume 3379, Infrared Detectors and Focal Plane Arrays V; (1998) https://doi.org/10.1117/12.317617
Event: Aerospace/Defense Sensing and Controls, 1998, Orlando, FL, United States

Abstract

The MOSAD, Multiplexed Oversampled Analog to Digital conversion approach at Amain Electronics research center, introduces an extremely low power on focal plane analog to digital conversion at each pixel site. The MOSAD technology has been tested and characterized for different focal plane array sizes. This approach has demonstrated superior linearity, well capacity and signal to noise ratio, which exceeds existing A/D capabilities, by eliminating all analog multiplexing and readout electronics off focal plane. This document describes the design, characterization and testing methodology to satisfy the variety of requirements for the readout interface to the MOSAD technology. The necessary readout interface electronics used to validate the MOSAD technology with Dewar assembly is presented. Results from the testing performance considerations such as signal to noise ratio are discussed. Amain Electronics test methodology considerations are described to show that an all digital focal plane array simplifies the future FPA test complexity and methodology.

Citation Download Citation

Jan M. Braathen "Test system design used to characterize and test the MOSAD technology multiplexed oversampled A/D all-digital FPA", Proc. SPIE 3379, Infrared Detectors and Focal Plane Arrays V, (22 July 1998); https://doi.org/10.1117/12.317617

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