Paper
31 March 1998 Influence of flange, frequency, and liftoff on microwave detection of stress-induced fatigue cracks using open-ended rectangular waveguides
Nasser Qaddoumi, Emarit Ranu, Philip I. Stepanek, Radin Mirshahi, Reza Zoughi, J. David McColskey, Richard A. Livingston
Author Affiliations +
Abstract
The influence of the waveguide flange, frequency of operation and liftoff on crack detection sensitivity using the dominant mode as well as the higher-order mode approaches are presented. The results indicate that the optimal choice of these parameters can significantly enhance crack detection sensitivity in practical applications.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nasser Qaddoumi, Emarit Ranu, Philip I. Stepanek, Radin Mirshahi, Reza Zoughi, J. David McColskey, and Richard A. Livingston "Influence of flange, frequency, and liftoff on microwave detection of stress-induced fatigue cracks using open-ended rectangular waveguides", Proc. SPIE 3396, Nondestructive Evaluation of Materials and Composites II, (31 March 1998); https://doi.org/10.1117/12.301525
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KEYWORDS
Sensors

Waveguides

Microwave radiation

Signal detection

Ka band

Inspection

Signal to noise ratio

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