Characterization of a VPE gallium arsenide x-gamma-ray detector

Giuseppe Bertuccio; D. Maiocchi; C. Rente; Arno Foerster; Hans Luth

doi:10.1117/12.330324

10 November 1998 Characterization of a VPE gallium arsenide x-gamma-ray detector

Giuseppe Bertuccio, D. Maiocchi, C. Rente, Arno Foerster, Hans Luth

Proceedings Volume 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX; (1998) https://doi.org/10.1117/12.330324
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

An x-(gamma) ray detector constituted by a 1 mm² Schottky junction on Vapor Phase Epitaxy gallium arsenide is presented. The junction has been characterized by means of capacitance and current vs. voltage analyses, finding a good agreement with the theory. Thanks to the low impurity concentration of the undoped epitaxial layer, an active region depth of 20 micrometers is reached at 100 V bias voltage. A reverse current density of 18 nA/cm² has been measured at 290 K in operating condition. The detector has been tested at room temperature with a ²⁴¹Am X-(gamma) source; the pulser line shows 1.41 keV FWHM and the 59.54 keV line shows 1.47 keV FWHM, corresponding to an energy resolution of 2.5 percent.

Citation Download Citation

Giuseppe Bertuccio, D. Maiocchi, C. Rente, Arno Foerster, and Hans Luth "Characterization of a VPE gallium arsenide x-gamma-ray detector", Proc. SPIE 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX, (10 November 1998); https://doi.org/10.1117/12.330324

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