Paper
6 July 1998 Extension of electronic speckle correlation interferometry to large deformations
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Abstract
The process of fringe formation under simultaneous illumination in two orthogonal directions is analyzed. Procedures to extend the applicability of this technique to large deformation and high density of fringes are introduced. The proposed techniques are applied to a number of technical problems. Good agreement is obtained when the experimental results are compared with results obtained by other methods.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Cesar A. Sciammarella and Federico M. Sciammarella "Extension of electronic speckle correlation interferometry to large deformations", Proc. SPIE 3479, Laser Interferometry IX: Applications, (6 July 1998); https://doi.org/10.1117/12.316456
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CITATIONS
Cited by 6 scholarly publications.
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KEYWORDS
Fourier transforms

Speckle

Interferometry

Microscopes

Particles

Polarization

Sensors

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