Microstructural investigation of La1.9Sr0.1CuO4 thin films grown by MBE

Jeongwoo Seo; Joel Perret; J. Fompeyrine; Gustaaf Van Tendeloo; Jean-Pierre Locquet

doi:10.1117/12.335901

22 December 1998 Microstructural investigation of La1.9Sr0.1CuO4 thin films grown by MBE

Jeongwoo Seo, Joel Perret, J. Fompeyrine, Gustaaf Van Tendeloo, Jean-Pierre Locquet

Proceedings Volume 3481, Superconducting and Related Oxides: Physics and Nanoengineering III; (1998) https://doi.org/10.1117/12.335901
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

The microstructure of La_1.9Sr_0.1CuO₄ thin films grown by molecular beam epitaxy on SrLaAlO₄ and SrTiO₃ is investigated by transmission electron microscopy. Using SrLaAlO₄ as substrate material, compressive strain is induced, which leads to a drastic increase of T_c. In contrast, SrTiO₃ yields a tensile strain and a decrease of T_c. The film on SrLaAlO₄ has a low defect density. Only misfit dislocations with an average spacing of 200 nm are found, which are more or less irregularly distributed. For SrTiO₃, a periodic array of misfit dislocations is present with an average distance of 16 nm. At the interface, as derived from the comparison with simulated images, (LaSr)₂CuAlO_6-x and (LaSr)TiO_3-x are formed on SrLaAlO₄ and SrTiO₃, respectively. These intermediate layers are found to increase the corresponding compressive and tensile strain further. The lattice deformation is determined based on lattice-image analysis. Here, the distance of CuO₂ planes can be measured locally. It turns out that applying a compressive or tensile strain increases or decreases the distance between CuO₂ planes. Accordingly, direct evidence is presented that a decoupling of CuO₂ planes leads to an increase of T_c, which is in contradiction to recent theoretical predictions.

Citation Download Citation

Jeongwoo Seo, Joel Perret, J. Fompeyrine, Gustaaf Van Tendeloo, and Jean-Pierre Locquet "Microstructural investigation of La1.9Sr0.1CuO4 thin films grown by MBE", Proc. SPIE 3481, Superconducting and Related Oxides: Physics and Nanoengineering III, (22 December 1998); https://doi.org/10.1117/12.335901

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