Comparison of optical analysis methods for oxide-apertured VCSELs

Michael J. Noble; John P. Loehr; James A. Lott

doi:10.1117/12.356895

6 August 1999 Comparison of optical analysis methods for oxide-apertured VCSELs

Michael J. Noble, John P. Loehr, James A. Lott

Proceedings Volume 3625, Physics and Simulation of Optoelectronic Devices VII; (1999) https://doi.org/10.1117/12.356895
Event: Optoelectronics '99 - Integrated Optoelectronic Devices, 1999, San Jose, CA, United States

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Michael J. Noble, John P. Loehr, and James A. Lott "Comparison of optical analysis methods for oxide-apertured VCSELs", Proc. SPIE 3625, Physics and Simulation of Optoelectronic Devices VII, (6 August 1999); https://doi.org/10.1117/12.356895

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