Reliability and degradation mechanisms of high-power diode lasers

Juergen Jandeleit; Nicolas Wiedmann; Peter Loosen; Reinhart Poprawe

doi:10.1117/12.345432

14 April 1999 Reliability and degradation mechanisms of high-power diode lasers

Juergen Jandeleit, Nicolas Wiedmann, Peter Loosen, Reinhart Poprawe

Proceedings Volume 3626, Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV; (1999) https://doi.org/10.1117/12.345432
Event: Optoelectronics '99 - Integrated Optoelectronic Devices, 1999, San Jose, CA, United States

Abstract

The degradation of GaAlAs/GaAs laser diode bars mounted on copper micro channel heat sinks was investigated using optical microscopy, scanning electron microscopy and EDX- spectroscopy. The high power diode lasers were characterized before and after burn-in and after long term lifetests. Changes in surface morphology and surface composition of the facets were detected as well as changes in threshold current, slope efficiency and wavelength. Due to the degradation threshold current increases and slope efficiency decreases while the wavelengths were shifted to higher values showing a broader spectral width. The influence of these changes on performance and lifetime of the high power diode lasers will be discussed.

Citation Download Citation

Juergen Jandeleit, Nicolas Wiedmann, Peter Loosen, and Reinhart Poprawe "Reliability and degradation mechanisms of high-power diode lasers", Proc. SPIE 3626, Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV, (14 April 1999); https://doi.org/10.1117/12.345432

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