Characterization measurements of the wideband infrared scene projector resistor array: III

Lawrence E. Jones; Robert Lee Murrer Jr.; Robert G. Stockbridge; Virgil G. Timms; Andrew W. Guertin

doi:10.1117/12.352904

19 July 1999 Characterization measurements of the wideband infrared scene projector resistor array: III

Lawrence E. Jones, Robert Lee Murrer Jr., Robert G. Stockbridge, Virgil G. Timms, Andrew W. Guertin

Proceedings Volume 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV; (1999) https://doi.org/10.1117/12.352904
Event: AeroSense '99, 1999, Orlando, FL, United States

Abstract

This paper discusses the performance of the Wideband Infrared Scene Projector (WISP) phase III arrays. Characterization measurements including: spectral output, dynamic range capability, apparent temperature, rise time, and fall time, have been accomplished on the WISP-III array at the Kinetic Kill Vehicle Hardware-in-the Loop Simulator facility and the Guided Weapons Evaluation Facility, Eglin AFB, FL.

Citation Download Citation

Lawrence E. Jones, Robert Lee Murrer Jr., Robert G. Stockbridge, Virgil G. Timms, and Andrew W. Guertin "Characterization measurements of the wideband infrared scene projector resistor array: III", Proc. SPIE 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV, (19 July 1999); https://doi.org/10.1117/12.352904

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