Holographic interferometry applied to real-time dynamic modal analysis of an advanced exotic metal alloy airfoil structure

Howard Fein

doi:10.1117/12.352934

19 July 1999 Holographic interferometry applied to real-time dynamic modal analysis of an advanced exotic metal alloy airfoil structure

Howard Fein

Author Affiliations +

Proceedings Volume 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV; (1999) https://doi.org/10.1117/12.352934
Event: AeroSense '99, 1999, Orlando, FL, United States

Abstract

Holographic Interferometry has been successfully employed to characterize the materials and behavior of diverse types of structures under stress. Specialized variations of this technology have also been applied to define dynamic and vibration related structural behavior. Such applications of holographic technique offer some of the most effective methods of modal and dynamic analysis available. Real-time dynamic testing of the structural behavior of aerodynamic control and airfoil structures for advanced aircraft and missile systems has traditionally required advanced instrumentation for data collection in either actual flight test or wind-tunnel simulations. Advanced optical holography techniques are alternate methods which result in full-field behavioral data on the ground in a nondestructive hardware- in-the-loop environment. These methods offer significant insight in both the development and subsequent operational test and modeling of advanced control and airfoil structures and their integration with total vehicle system dynamics. Aerodynamic control structures and components can be analyzed in place with very low amplitude excitation and the resultant data can be used to adjust the accuracy of mathematically derived structural and behavioral models as well actual performance.

Citation Download Citation

Howard Fein "Holographic interferometry applied to real-time dynamic modal analysis of an advanced exotic metal alloy airfoil structure", Proc. SPIE 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV, (19 July 1999); https://doi.org/10.1117/12.352934

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