Future characterization needs for optical materials

Michael E. Thomas; William J. Tropf

doi:10.1117/12.354566

26 July 1999 Future characterization needs for optical materials

Michael E. Thomas, William J. Tropf

Proceedings Volume 3698, Infrared Technology and Applications XXV; (1999) https://doi.org/10.1117/12.354566
Event: AeroSense '99, 1999, Orlando, FL, United States

Abstract

Optical material characterization encompasses absorption, refraction and scattering phenomena as a function of frequency and temperature. The level of knowledge of the optical constants for most optical materials is sparse, especially at temperatures outside of room temperature. Critical future applications will require a more complete database. The need for greater precision in the optical constants requires both improved experimental techniques and more detailed modes. Since a comprehensive experimental database is impossible, physically-based models, allowing accurate interpolation and extrapolation, are an essential part of optical characterization. Furthermore, most optical constant characterization is reported in the frequency- domain. However, high-speed optoelectronic materials require time-domain characterization.

Citation Download Citation

Michael E. Thomas and William J. Tropf "Future characterization needs for optical materials", Proc. SPIE 3698, Infrared Technology and Applications XXV, (26 July 1999); https://doi.org/10.1117/12.354566

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