Paper
26 July 1999 Arc jet testing of a Dynasil dome
Jack O. Burrell, Forrest A. Strobel
Author Affiliations +
Abstract
Arc jet testing of the Hera modified ballistic reentry vehicle - 1E (MBRV-1E) nosetip was conducted in June of 1998. The tests were conducted in the Air Force's Arnold Engineering Development Center HEAT-H1 arc plasma test facility in Tullahoma, Tennessee. The MBRV-1 vehicle is a separating short- to medium-range target. The MBRV-1E nosetip incorporates a custom designed quartz dome that is integrated into the nosetip stagnation region. The dome was bonded to the baseline nosetip material, a well characterized carbon-carbon composite material, using a silica based ceramic bond materials. The objectives of the test were to demonstrate the thermal performance and structural integrity of the nosetip design by exposing tip to arc plasma-heated flow simulating the reentry flight environment. Pre-test analysis of the Dynasil dome performed using finite element analysis predicted the dome would survive the test conditions with no failures. Post-test inspection of the dome revealed a hard, opaque coating on the outer surface of the dome. Once removed, the dome was shown to have numerous surface cracks near the stagnation region. In addition to the surface cracks, significant pitting on the surface was observed through both an optical microscope and a scanning electron microscope. Post-test analyses were performed to determine the cause of these surface cracks. It was concluded that the cracks occurred during cooldown, and were a result of significant strength degradation which was caused by the surface pitting.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jack O. Burrell and Forrest A. Strobel "Arc jet testing of a Dynasil dome", Proc. SPIE 3705, Window and Dome Technologies and Materials VI, (26 July 1999); https://doi.org/10.1117/12.354635
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KEYWORDS
Particles

Coating

Copper

Surface finishing

Temperature metrology

Opacity

Scanning electron microscopy

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